Basics and principles of instrumental analytics,
fundamentals of selected analytical methods e.g. mass spectroscopy, scanning electron microscopy, X-ray fluorescence spectrometry,
sample preparation, performing of measurements and evaluation of the results,
Learning Outcomes, Targeted Competencies:
The students are well introduced into the basics and principles of instrumental analytics and they know how to evaluate results. The students gained basic analytical skills and get acquainted with application fields and limitations of various analytical methods.
The students know the fundamentals of selected analytical methods in the field of spectroscopy, imaging techniques and surface analytics. The students understand to perform measurements and they are able to characterize various materials.
56.0 h presence time 80.0 h self-study 44.0 h exam workload
180 h total workload
exam elements: 1 SL: 1
100 % Portfolio 0 % internship report
Written exam is compulsory and the submission of reports is voluntary, but complete number of successfully certified reports will increase the final grade by one level.
Goldstein, J. et al.: Scanning electron microscopy and X-ray microanalysis, Kluwer Academic/Plenum Publ. (2003)
Potts, P.J.: A Handbook of Silicate Rock Analysis, Blackie&Son, Glasgow (1992) AAS, ICP-OES, XRF, EDX, Microprobe, ICP-MS, u.a. Reed, S.J.B.: Electron microprobe analysis and scanning electron microscopy in geology (2005) Margui, E. (2013): X-ray fluorescence spectrometry and related techniques : an introduction