05-MCM-2-P6 Analytical Methods II

Representative: Michael Wendschuh

Content

This module is a continuation of analytical methods I. It covers additional methods of instrumental analytics.

Learning Outcome

Knowledge of application fields and limitations of various analytical methods

Requirements

Basics and principles of instrumental analytics

Workload

180 hours / 6 CP
14 x 5 = 70 h presence time
14 x 5 = 70 h preparation and post processing
40 h exams and preparation

Examination

module exam (combined marks):

laboratory reportnot graded
written exam100 %

Literature

• Goldstein, J. et al.: Scanning electron microscopy and X-ray microanalysis, Kluwer Academic/Plenum Publ. (2003)
• Potts, P.J.: A Handbook of Silicate Rock Analysis, Blackie&Son, Glasgow (1992) AAS, ICP-OES, XRF, EDX, Microprobe, ICP-MS, u.a.
• Perry, D.L.: Instrumental Surface Analysis of Geological Materials, VCH-Verlag (1990)


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